SOURCE: Test Equipment Connection Corporation
Test Equipment Connection Announces Product Support for Agilent N5230A PNA-L Network Analyzer
(PRWEB) August 11, 2012
Beginning August, 2012, Test Equipment Connection will provide refurbished solutions for the Agilent N5230A PNA-L Network Analyzer, which has been discontinued from Agilent.
The PNA Series builds on Agilent’s 40-year legacy of excellence to deliver new standards in speed, accuracy, and versatility for microwave network analysis. The PNA’s architecture includes high quality, stable hardware and flexible software. The standard PNA is suitable for testing passive and active devices such as filters and amplifiers. Users can easily add options to test mixers, harmonics, intermodulation distortion (IMD), pulsed-RF, antennas and millimeter-wave (mmwave) components.
The Agilent PNA-L is designed for your general-purpose network analysis needs and priced for your budget. With the same firmware as the PNA, the PNA-L offers the perfect balance of value and performance. PNA-L provides efficiency and flexibility in both manufacturing and R&D applications, for industries ranging from wireless LAN component production to aerospace and defense.
Easily measure single-ended, balanced, and mixed-mode S-parameters, in addition to ratioed and unratioed receiver measurements.
New multiport components require complicated test plans. Multiple port combinations must be tested over several frequency bands, resulting in lengthy tests. To reduce test time and lower costs, the PNA-L/PNA-X and test set combinations have been designed for high-speed measurements. To further simplify complex test requirements, up to 32 independent channels are available, eliminating the need for recalling instrument states.
Key Features & Specifications
Integrated 4-port, balanced measurements
103 dB dynamic range and < 0.004 dB trace noise
4.5 usec/point measurement speed, 32 channels, 16,001 points
Automatic port extension automatically corrects for in-fixture measurements
Optional second internal source for fast measurements of amplifier intermodulation distortion and mixer/converter conversion loss
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